Raman investigation of the localized vibrational mode of carbon in strain-relaxed Si1-xGex:C

Ken Morita; Kohei M. Itoh; Lone Hoffmann; Brian B. Nielsen; Hiroshi Harima; Kohji Mizoguchi

doi:10.1143/jjap.40.5905

Raman investigation of the localized vibrational mode of carbon in strain-relaxed Si_1-xGe_x:C

Ken Morita, Kohei M. Itoh, Lone Hoffmann, Brian B. Nielsen, Hiroshi Harima, Kohji Mizoguchi

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Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

The localized vibrational mode (LVM) of carbon in strain-relaxed Si_1-xGe_x:C samples with x = 0, 0.05, 0.35, and 0.5 have been investigated by Raman spectroscopy at room- and liquid-nitrogen-temperatures. The position of the Raman peaks due to LVM of carbon shifts linearly to lower frequencies with increasing x from 0 to 0.5. The LVM frequencies of carbon obtained by Raman measurement agree very well with those determined by Hoffmann et al. in infrared (IR) absorption recently.

Original language	English
Pages (from-to)	5905-5906
Number of pages	2
Journal	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume	40
Issue number	10
DOIs	https://doi.org/10.1143/jjap.40.5905
Publication status	Published - 2001 Oct

Keywords

Infrared absorption
Localized vibrational mode of carbon
Raman-spectroscopy
SiGe:C

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

Access to Document

10.1143/jjap.40.5905

Cite this

@article{2f7c285e4ac748c59746ff18e4b766fd,

title = "Raman investigation of the localized vibrational mode of carbon in strain-relaxed Si1-xGex:C",

abstract = "The localized vibrational mode (LVM) of carbon in strain-relaxed Si1-xGex:C samples with x = 0, 0.05, 0.35, and 0.5 have been investigated by Raman spectroscopy at room- and liquid-nitrogen-temperatures. The position of the Raman peaks due to LVM of carbon shifts linearly to lower frequencies with increasing x from 0 to 0.5. The LVM frequencies of carbon obtained by Raman measurement agree very well with those determined by Hoffmann et al. in infrared (IR) absorption recently.",

keywords = "Infrared absorption, Localized vibrational mode of carbon, Raman-spectroscopy, SiGe:C",

author = "Ken Morita and Itoh, {Kohei M.} and Lone Hoffmann and Nielsen, {Brian B.} and Hiroshi Harima and Kohji Mizoguchi",

year = "2001",

month = oct,

doi = "10.1143/jjap.40.5905",

language = "English",

volume = "40",

pages = "5905--5906",

journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers",

issn = "0021-4922",

publisher = "Japan Society of Applied Physics",

number = "10",

}

TY - JOUR

T1 - Raman investigation of the localized vibrational mode of carbon in strain-relaxed Si1-xGex:C

AU - Morita, Ken

AU - Itoh, Kohei M.

AU - Hoffmann, Lone

AU - Nielsen, Brian B.

AU - Harima, Hiroshi

AU - Mizoguchi, Kohji

PY - 2001/10

Y1 - 2001/10

N2 - The localized vibrational mode (LVM) of carbon in strain-relaxed Si1-xGex:C samples with x = 0, 0.05, 0.35, and 0.5 have been investigated by Raman spectroscopy at room- and liquid-nitrogen-temperatures. The position of the Raman peaks due to LVM of carbon shifts linearly to lower frequencies with increasing x from 0 to 0.5. The LVM frequencies of carbon obtained by Raman measurement agree very well with those determined by Hoffmann et al. in infrared (IR) absorption recently.

AB - The localized vibrational mode (LVM) of carbon in strain-relaxed Si1-xGex:C samples with x = 0, 0.05, 0.35, and 0.5 have been investigated by Raman spectroscopy at room- and liquid-nitrogen-temperatures. The position of the Raman peaks due to LVM of carbon shifts linearly to lower frequencies with increasing x from 0 to 0.5. The LVM frequencies of carbon obtained by Raman measurement agree very well with those determined by Hoffmann et al. in infrared (IR) absorption recently.

KW - Infrared absorption

KW - Localized vibrational mode of carbon

KW - Raman-spectroscopy

KW - SiGe:C

UR - http://www.scopus.com/inward/record.url?scp=0035484392&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035484392&partnerID=8YFLogxK

U2 - 10.1143/jjap.40.5905

DO - 10.1143/jjap.40.5905

M3 - Article

AN - SCOPUS:0035484392

SN - 0021-4922

VL - 40

SP - 5905

EP - 5906

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

IS - 10

ER -