TY - GEN
T1 - Recent advances in near-field optical microscopy
AU - Saiki, T.
N1 - Publisher Copyright:
© 2002 IEEE.
Copyright:
Copyright 2017 Elsevier B.V., All rights reserved.
PY - 2002
Y1 - 2002
N2 - Summary form only given. Current progress in the instrumentation and measurements of NSOM is described. The most critical element in NSOM is an aperture probe, which is a tapered and metal-coated optical fiber. The design and fabrication of the probe are examined with regard to aperture quality and the efficiency of light propagation. The recent dramatic improvements in spatial resolution and optical throughput are illustrated by selected applications, Raman spectroscopy, polarization microscopy, and the emission imaging of semiconductor nanostructures and single molecules. Real-space mapping of exciton wavefunctions confined in a quantum dot is also demonstrated as an application of NSOM to wavefunction engineering.
AB - Summary form only given. Current progress in the instrumentation and measurements of NSOM is described. The most critical element in NSOM is an aperture probe, which is a tapered and metal-coated optical fiber. The design and fabrication of the probe are examined with regard to aperture quality and the efficiency of light propagation. The recent dramatic improvements in spatial resolution and optical throughput are illustrated by selected applications, Raman spectroscopy, polarization microscopy, and the emission imaging of semiconductor nanostructures and single molecules. Real-space mapping of exciton wavefunctions confined in a quantum dot is also demonstrated as an application of NSOM to wavefunction engineering.
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U2 - 10.1109/IMNC.2002.1178516
DO - 10.1109/IMNC.2002.1178516
M3 - Conference contribution
AN - SCOPUS:84960413858
T3 - 2002 International Microprocesses and Nanotechnology Conference, MNC 2002
SP - 6
EP - 7
BT - 2002 International Microprocesses and Nanotechnology Conference, MNC 2002
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - International Microprocesses and Nanotechnology Conference, MNC 2002
Y2 - 6 November 2002 through 8 November 2002
ER -