TY - GEN
T1 - Reinforcement Learning System Comprising Resistive Analog Neuromorphic Devices
AU - Kim, Song Ju
AU - Ohkoda, Kaori
AU - Aono, Masashi
AU - Shima, Hisashi
AU - Takahashi, Makoto
AU - Naitoh, Yasuhisa
AU - Akinaga, Hiroyuki
N1 - Funding Information:
This work is based on results obtained from a project commissioned by NEDO (Grant Number: 16101009-0).
Publisher Copyright:
© 2019 IEEE.
PY - 2019/5/22
Y1 - 2019/5/22
N2 - Reinforcement learning algorithms are widely used in many practical artificial-intelligence (AI) applications. Herein, we propose a compact hardware-based learning system comprising analogue resistive memory devices called 'resistive analogue neuromorphic devices (RAND).' We begin by showing that the resistance of a RAND linearly varies with the voltage pulses, meaning that a single RAND is sufficient to solve a reinforcement learning problem (i.e. the '2-armed bandit problem') using 'tug-of-war (TOW) dynamics.' Next, we show that 2k-armed bandit problems are also solved by hierarchically combining 2k-1 RANDs. Finally, we numerically demonstrate that the proposed methods are promising as compared with conventional methods.
AB - Reinforcement learning algorithms are widely used in many practical artificial-intelligence (AI) applications. Herein, we propose a compact hardware-based learning system comprising analogue resistive memory devices called 'resistive analogue neuromorphic devices (RAND).' We begin by showing that the resistance of a RAND linearly varies with the voltage pulses, meaning that a single RAND is sufficient to solve a reinforcement learning problem (i.e. the '2-armed bandit problem') using 'tug-of-war (TOW) dynamics.' Next, we show that 2k-armed bandit problems are also solved by hierarchically combining 2k-1 RANDs. Finally, we numerically demonstrate that the proposed methods are promising as compared with conventional methods.
KW - Decision making
KW - Natural computing
KW - RAND
KW - Reinforcement learning
KW - TOW dynamics
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U2 - 10.1109/IRPS.2019.8720428
DO - 10.1109/IRPS.2019.8720428
M3 - Conference contribution
AN - SCOPUS:85066745105
T3 - IEEE International Reliability Physics Symposium Proceedings
BT - 2019 IEEE International Reliability Physics Symposium, IRPS 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2019 IEEE International Reliability Physics Symposium, IRPS 2019
Y2 - 31 March 2019 through 4 April 2019
ER -