Abstract
In this paper, we derive the analytical expressions for the secure outage probability in a single-input single-output (SISO) system over fading, in which both the main and eavesdropper channels are subject to κ-μ fading. Many authors have analyzed the secrecy performance of such a SISO system over various fading models. More recently, a lower bound on the secure outage probability over κ-μ fading has been reported. However, the exact analytical expression of secure outage probability over κ-μ fading has not been obtained. The problem with using the lower bound is that we are not sure about the tightness of the bound. Our result is an exact expression which is verified by Monte-Carlo simulations. Furthermore, it enables us to examine the behavior of the secure outage probability as a function of the fading parameters of both the main and eavesdropper channels for given values of the average signal-to-noise power ratio (SNR) over these channels. Exact expressions for the case of Nakagami-m and Rician fading models for both the main and eavesdropper channels are also obtained and verified by simulations.
Original language | English |
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Title of host publication | 2017 IEEE International Conference on Communications, ICC 2017 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9781467389990 |
DOIs | |
Publication status | Published - 2017 Jul 28 |
Event | 2017 IEEE International Conference on Communications, ICC 2017 - Paris, France Duration: 2017 May 21 → 2017 May 25 |
Other
Other | 2017 IEEE International Conference on Communications, ICC 2017 |
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Country/Territory | France |
City | Paris |
Period | 17/5/21 → 17/5/25 |
Keywords
- Nakagami-m fading channel
- Physical layer security
- probability of strictly positive secrecy capacity
- Rician fading channel
- secure outage probability
- κ - μ fading channel
ASJC Scopus subject areas
- Computer Networks and Communications
- Electrical and Electronic Engineering