TY - GEN
T1 - Sensing of heat source in deep layer using heat flow
AU - Osawa, Yukiko
AU - Katsura, Seiichiro
N1 - Funding Information:
This work was supported by JSPS KAKENHI Grant Number JP17J06070.
Publisher Copyright:
© 2017 SICE.
PY - 2017/11/10
Y1 - 2017/11/10
N2 - Heat sensing is necessary for human health care and industrial fields. In many cases, the abnormality of human body or machine is appeared as a heat source. For example, a cancer cell is higher temperature by up to 2 or 3 degree on the skin surface over the tumor. Therefore, abnormal detection is possible to sense through the heat distribution in the material. There are many sensors for observing temperature such as thermocouple, thermistor, thermography, and so on. However, sensing in deep layer of material using these sensors are difficult. This paper proposed the sensing method for detecting heat source inside the material by using heat flow. The method uses an algorithm that heat flow is changed depending on temperature difference. Some experiments are conducted to verify the proposed method.
AB - Heat sensing is necessary for human health care and industrial fields. In many cases, the abnormality of human body or machine is appeared as a heat source. For example, a cancer cell is higher temperature by up to 2 or 3 degree on the skin surface over the tumor. Therefore, abnormal detection is possible to sense through the heat distribution in the material. There are many sensors for observing temperature such as thermocouple, thermistor, thermography, and so on. However, sensing in deep layer of material using these sensors are difficult. This paper proposed the sensing method for detecting heat source inside the material by using heat flow. The method uses an algorithm that heat flow is changed depending on temperature difference. Some experiments are conducted to verify the proposed method.
KW - Detection of heat source
KW - Heat flow
KW - Peltier device
KW - Sensing
UR - http://www.scopus.com/inward/record.url?scp=85044217443&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85044217443&partnerID=8YFLogxK
U2 - 10.23919/SICE.2017.8105480
DO - 10.23919/SICE.2017.8105480
M3 - Conference contribution
AN - SCOPUS:85044217443
T3 - 2017 56th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2017
SP - 416
EP - 419
BT - 2017 56th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 56th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2017
Y2 - 19 September 2017 through 22 September 2017
ER -
