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Specimen size effect of interface strength distribution induced by grain structure of Cu line
Chuantong Chen, Nobuyuki Shishido, Kozo Koiwa, Shoji Kamiya, Hisashi Sato, Masahiro Nishida, Masaki Omiya, Takashi Suzuki, Tomoji Nakamura, Toshiaki Suzuki, Takeshi Nokuo
Research output: Contribution to journal › Article › peer-review