Structural and impedance studies on LaF3 thin films prepared by vacuum evaporation

M. Vijayakumar; S. Selvasekarapandian; T. Gnanasekaran; Shinobu Fujihara; Shinnosuke Koji

doi:10.1016/j.jfluchem.2004.02.001

Structural and impedance studies on LaF₃ thin films prepared by vacuum evaporation

M. Vijayakumar, S. Selvasekarapandian, T. Gnanasekaran, Shinobu Fujihara, Shinnosuke Koji

Department of Applied Chemistry

Research output: Contribution to journal › Article › peer-review

33 Citations (Scopus)

Abstract

Lanthanum fluoride thin film has been deposited on glass substrates by PVD method at various deposition temperatures (T_s), viz, 300, 473, 573 and 673 K. The hexagonal phase LaF₃ film has been detected by using glancing angle XRD analysis. The structural parameters such as lattice constants, grain size and micro-strain has been calculated from the XRD data. The F^- ion conduction through the grain and grain boundary has been analyzed using impedance analysis. The modulus spectra reveals the non-Debye nature and the distribution of relaxation times of the film.

Original language	English
Pages (from-to)	1119-1125
Number of pages	7
Journal	Journal of Fluorine Chemistry
Volume	125
Issue number	7
DOIs	https://doi.org/10.1016/j.jfluchem.2004.02.001
Publication status	Published - 2004 Jul

Keywords

Impedance spectroscopy
LaF
Modulus analysis
XRD analysis

ASJC Scopus subject areas

Biochemistry
Environmental Chemistry
Physical and Theoretical Chemistry
Organic Chemistry
Inorganic Chemistry

Access to Document

10.1016/j.jfluchem.2004.02.001

Cite this

@article{ec71a772b9604cd181a0c9fb71a072f6,

title = "Structural and impedance studies on LaF3 thin films prepared by vacuum evaporation",

abstract = "Lanthanum fluoride thin film has been deposited on glass substrates by PVD method at various deposition temperatures (Ts), viz, 300, 473, 573 and 673 K. The hexagonal phase LaF3 film has been detected by using glancing angle XRD analysis. The structural parameters such as lattice constants, grain size and micro-strain has been calculated from the XRD data. The F- ion conduction through the grain and grain boundary has been analyzed using impedance analysis. The modulus spectra reveals the non-Debye nature and the distribution of relaxation times of the film.",

keywords = "Impedance spectroscopy, LaF, Modulus analysis, XRD analysis",

author = "M. Vijayakumar and S. Selvasekarapandian and T. Gnanasekaran and Shinobu Fujihara and Shinnosuke Koji",

note = "Funding Information: Authors wish to thank Prof. B.A. Boukamp and Prof. Issac Abrahams for providing software for impedance data analysis. One of the authors M. Vijayakumar acknowledges the Council of Scientific and Industrial Research (CSIR), Government of India, for Senior Research Fellowship (SRF).",

year = "2004",

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doi = "10.1016/j.jfluchem.2004.02.001",

language = "English",

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journal = "Journal of Fluorine Chemistry",

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T1 - Structural and impedance studies on LaF3 thin films prepared by vacuum evaporation

AU - Vijayakumar, M.

AU - Selvasekarapandian, S.

AU - Gnanasekaran, T.

AU - Fujihara, Shinobu

AU - Koji, Shinnosuke

N1 - Funding Information: Authors wish to thank Prof. B.A. Boukamp and Prof. Issac Abrahams for providing software for impedance data analysis. One of the authors M. Vijayakumar acknowledges the Council of Scientific and Industrial Research (CSIR), Government of India, for Senior Research Fellowship (SRF).

PY - 2004/7

Y1 - 2004/7

N2 - Lanthanum fluoride thin film has been deposited on glass substrates by PVD method at various deposition temperatures (Ts), viz, 300, 473, 573 and 673 K. The hexagonal phase LaF3 film has been detected by using glancing angle XRD analysis. The structural parameters such as lattice constants, grain size and micro-strain has been calculated from the XRD data. The F- ion conduction through the grain and grain boundary has been analyzed using impedance analysis. The modulus spectra reveals the non-Debye nature and the distribution of relaxation times of the film.

AB - Lanthanum fluoride thin film has been deposited on glass substrates by PVD method at various deposition temperatures (Ts), viz, 300, 473, 573 and 673 K. The hexagonal phase LaF3 film has been detected by using glancing angle XRD analysis. The structural parameters such as lattice constants, grain size and micro-strain has been calculated from the XRD data. The F- ion conduction through the grain and grain boundary has been analyzed using impedance analysis. The modulus spectra reveals the non-Debye nature and the distribution of relaxation times of the film.

KW - Impedance spectroscopy

KW - LaF

KW - Modulus analysis

KW - XRD analysis

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