TY - GEN
T1 - Study of energy relaxation processes of the surface produced negative ions by using 3D3V-PIC simulation
AU - Miyamoto, K.
AU - Goto, I.
AU - Nishioka, S.
AU - Hatayama, A.
AU - Hiratsuka, J.
AU - Hanada, M.
AU - Kojima, A.
N1 - Funding Information:
This work was supported by a Grant-in-id for Scientific Research (C) (KAKENHI No.26400533) from the Japan Society for the Promotion of Science (JPSJ).
PY - 2017/8/9
Y1 - 2017/8/9
N2 - The energy relaxation processes of the surface produced H-ions due to the Coulomb collision and the charge exchange collision is verified by using 3D3V-PIC (three dimensions in real space and three dimensions in velocity space particle in cell) simulation. Under the present simulation condition (ne = 1.0 × 1018 m-3, TH+ = 0.25 eV, TH-= 1.5 eV (the initial temperature of the surface produced H-ion), nH/nH2 =0.5, nH = 9.4 ×1018 m-3, TH = 0.1 eV ), it is indicated the Coulomb collision is dominant for the energy relaxation processes. Moreover, it is indicated from the emittance diagrams that the H-ion beam optics is improved by the energy relaxation processes.
AB - The energy relaxation processes of the surface produced H-ions due to the Coulomb collision and the charge exchange collision is verified by using 3D3V-PIC (three dimensions in real space and three dimensions in velocity space particle in cell) simulation. Under the present simulation condition (ne = 1.0 × 1018 m-3, TH+ = 0.25 eV, TH-= 1.5 eV (the initial temperature of the surface produced H-ion), nH/nH2 =0.5, nH = 9.4 ×1018 m-3, TH = 0.1 eV ), it is indicated the Coulomb collision is dominant for the energy relaxation processes. Moreover, it is indicated from the emittance diagrams that the H-ion beam optics is improved by the energy relaxation processes.
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U2 - 10.1063/1.4995708
DO - 10.1063/1.4995708
M3 - Conference contribution
AN - SCOPUS:85030086207
T3 - AIP Conference Proceedings
BT - 5th International Symposium on Negative Ions, Beams and Sources, NIBS 2016
A2 - Faircloth, Dan
PB - American Institute of Physics Inc.
T2 - 5th International Symposium on Negative Ions, Beams and Sources, NIBS 2016
Y2 - 12 September 2016 through 16 September 2016
ER -