TY - JOUR
T1 - Study of negative ion beam emittance characteristic using 3D PIC-MCC simulation
AU - Miyamoto, K.
AU - Nagaoka, K.
AU - Hatayama, A.
AU - Hoshino, K.
AU - Nakano, H.
AU - Shibata, T.
AU - Tsumori, K.
N1 - Funding Information:
This work was supported by KAKENHI 18KK0080. This work is performed with the support and under the auspices of the NIFS Collaboration Research Program (NIFS17KLER061).
Publisher Copyright:
© Published under licence by IOP Publishing Ltd.
PY - 2022/4/25
Y1 - 2022/4/25
N2 - It is reported from the measurement of a negative ion beamlet emittance that the characteristic three-Gaussian components are observed in the emittance diagram. The negative ion trajectories are calculated using 3D PIC-MCC simulation in order to clarify the origin of this complicated phase space structure and underlying physical mechanism. The characteristic three-Gaussian components can be reproduced in the emittance diagram from the simulation result. It is verified that the Gaussian components are caused by the negative ions extracted from the different plasma meniscus region, that is, the central region or the region near the edges of the meniscus.
AB - It is reported from the measurement of a negative ion beamlet emittance that the characteristic three-Gaussian components are observed in the emittance diagram. The negative ion trajectories are calculated using 3D PIC-MCC simulation in order to clarify the origin of this complicated phase space structure and underlying physical mechanism. The characteristic three-Gaussian components can be reproduced in the emittance diagram from the simulation result. It is verified that the Gaussian components are caused by the negative ions extracted from the different plasma meniscus region, that is, the central region or the region near the edges of the meniscus.
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U2 - 10.1088/1742-6596/2244/1/012040
DO - 10.1088/1742-6596/2244/1/012040
M3 - Conference article
AN - SCOPUS:85129848770
SN - 1742-6588
VL - 2244
JO - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
IS - 1
M1 - 012040
T2 - 19th International Conference on Ion Sources, ICIS 2021
Y2 - 20 September 2021 through 24 September 2021
ER -