Thermal conductivity measurements of Sb-Te alloy thin films using a nanosecond thermoreflectance measurement system

Masashi Kuwahara; Osamu Suzuki; Naoyuki Taketoshi; Takashi Yagi; Paul Fons; Junji Tominaga; Tetsuya Baba

doi:10.1143/JJAP.46.6863

Thermal conductivity measurements of Sb-Te alloy thin films using a nanosecond thermoreflectance measurement system

Masashi Kuwahara, Osamu Suzuki, Naoyuki Taketoshi, Takashi Yagi, Paul Fons, Junji Tominaga, Tetsuya Baba

Research output: Contribution to journal › Article › peer-review

21 Citations (Scopus)

Abstract

Using a nanosecond thermoreflectance measurement system, which enables the measurement of the thermal conductivity of nanometer-scale thin films, we have measured the thermal conductivities of Sb₂Te, Sb₂ Te ₃, SbTeo, Sb, and Te thin films at room temperature. We clarified that the thermal conductivities of Sb-Te alloys depend on the Sb and Te atomic ratios. A large change in thermal conductivity was observed in the vicinity of the composition ratio of Sb₂Te₃. We proposed that this large change may be attributable to the formation of an Sb atomic network in the crystalline structure of the Sb-Te alloy.

Original language	English
Pages (from-to)	6863-6864
Number of pages	2
Journal	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume	46
Issue number	10 A
DOIs	https://doi.org/10.1143/JJAP.46.6863
Publication status	Published - 2007 Oct 9
Externally published	Yes

Keywords

Optical disks
Phase-change memory
Sb-Te alloys
Thermal conductivity
Thermoreflectance

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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10.1143/JJAP.46.6863

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Thermal conductivity measurements of Sb-Te alloy thin films using a nanosecond thermoreflectance measurement system. / Kuwahara, Masashi; Suzuki, Osamu; Taketoshi, Naoyuki et al.
In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 46, No. 10 A, 09.10.2007, p. 6863-6864.

Research output: Contribution to journal › Article › peer-review

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abstract = "Using a nanosecond thermoreflectance measurement system, which enables the measurement of the thermal conductivity of nanometer-scale thin films, we have measured the thermal conductivities of Sb2Te, Sb2 Te 3, SbTeo, Sb, and Te thin films at room temperature. We clarified that the thermal conductivities of Sb-Te alloys depend on the Sb and Te atomic ratios. A large change in thermal conductivity was observed in the vicinity of the composition ratio of Sb2Te3. We proposed that this large change may be attributable to the formation of an Sb atomic network in the crystalline structure of the Sb-Te alloy.",

keywords = "Optical disks, Phase-change memory, Sb-Te alloys, Thermal conductivity, Thermoreflectance",

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AU - Kuwahara, Masashi

AU - Suzuki, Osamu

AU - Taketoshi, Naoyuki

AU - Yagi, Takashi

AU - Fons, Paul

AU - Tominaga, Junji

AU - Baba, Tetsuya

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AB - Using a nanosecond thermoreflectance measurement system, which enables the measurement of the thermal conductivity of nanometer-scale thin films, we have measured the thermal conductivities of Sb2Te, Sb2 Te 3, SbTeo, Sb, and Te thin films at room temperature. We clarified that the thermal conductivities of Sb-Te alloys depend on the Sb and Te atomic ratios. A large change in thermal conductivity was observed in the vicinity of the composition ratio of Sb2Te3. We proposed that this large change may be attributable to the formation of an Sb atomic network in the crystalline structure of the Sb-Te alloy.

KW - Optical disks

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KW - Sb-Te alloys

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Thermal conductivity measurements of Sb-Te alloy thin films using a nanosecond thermoreflectance measurement system

Abstract

Keywords

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