TY - JOUR
T1 - Thermal interface fluctuations of liquids and viscoelastic materials
AU - Aoki, Kenichiro
AU - Mitsui, Takahisa
N1 - Funding Information:
We would like to thank A. Suzuki for preparing the agarose gel sample. K.A. was supported in part by a Grant-in-Aid for Scientific Research (Grant No. 15K05217) from the Japan Society for the Promotion of Science, and a grant from Keio University.
Publisher Copyright:
© 2018 Physical Society of Japan. All rights reserved.
PY - 2018/4/1
Y1 - 2018/4/1
N2 - Spectra of thermal fluctuations of a wide range of interfaces, from liquid/air, viscoelastic material/ air, liquid/liquid to liquid/viscoelastic material interfaces, were measured over a 100 Hz to 10MHz frequency range. The obtained spectra were compared with the fluctuation theory of interfaces, and found to be mostly in quite good agreement, when the theory was generalized to apply to thermal fluctuations of liquid/viscoelastic material interfaces. The loss modulus of viscoelastic materials has been incorporated into the theory, and its effects observed experimentally. The spectra were measured using a system that combines light reflection, statistical noise reduction through averaged correlations, and confocal microscopy. It requires only a small area of the interface (∼1μm2), relatively short times for measurements (≲ few min), and can also be applied to highly viscous materials.
AB - Spectra of thermal fluctuations of a wide range of interfaces, from liquid/air, viscoelastic material/ air, liquid/liquid to liquid/viscoelastic material interfaces, were measured over a 100 Hz to 10MHz frequency range. The obtained spectra were compared with the fluctuation theory of interfaces, and found to be mostly in quite good agreement, when the theory was generalized to apply to thermal fluctuations of liquid/viscoelastic material interfaces. The loss modulus of viscoelastic materials has been incorporated into the theory, and its effects observed experimentally. The spectra were measured using a system that combines light reflection, statistical noise reduction through averaged correlations, and confocal microscopy. It requires only a small area of the interface (∼1μm2), relatively short times for measurements (≲ few min), and can also be applied to highly viscous materials.
KW - J42
KW - J45
UR - http://www.scopus.com/inward/record.url?scp=85045510355&partnerID=8YFLogxK
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U2 - 10.1093/ptep/pty026
DO - 10.1093/ptep/pty026
M3 - Article
AN - SCOPUS:85045510355
SN - 2050-3911
VL - 2018
JO - Progress of Theoretical and Experimental Physics
JF - Progress of Theoretical and Experimental Physics
IS - 4
M1 - 043J01
ER -