Three-dimensional plastic strain mapping technique for X-ray micro-tomography

M. Kobayashi, H. Toda, Y. Kawai, M. Nakazawa, Y. Aoki, K. Uesugi, Y. Suzuki

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)

    Abstract

    Recently, X-ray micro-tomography has been utilized for characterization of deformation and fracture behaviors in materials. The micro-tomography that is available in the synchrotron facility can reveal the existence of particles and crack in about 1 μm resolution. In this study, three-dimensional mapping technique has been developed to observe inhomogeneous plastic deformation affected by metallurgical microstructures in small specimen. Marker-tracking method with predicting marker position was produced to obtain strain in inhomogeneously and highly deformed region. The model that simulates tensile test was produced with taking actual deformation pattern into consideration. Evaluation of ratios of success tracking and tracked marker showed good performance of the developed method. The prediction of marker position after deformation was very effective in tensile deformation with necking. Almost 100% ratios of success tracking and tracked marker were indicated not only in homogeneous deformation up to 10% strain but also in inhomogeneous deformation up to 5% strain.

    Original languageEnglish
    Title of host publicationMaterials Science and Technology Conference and Exhibition 2010, MS and T'10
    Pages1037-1044
    Number of pages8
    Publication statusPublished - 2010 Dec 1
    EventMaterials Science and Technology Conference and Exhibition 2010, MS and T'10 - Houston, TX, United States
    Duration: 2010 Oct 172010 Oct 21

    Publication series

    NameMaterials Science and Technology Conference and Exhibition 2010, MS and T'10
    Volume2

    Other

    OtherMaterials Science and Technology Conference and Exhibition 2010, MS and T'10
    Country/TerritoryUnited States
    CityHouston, TX
    Period10/10/1710/10/21

    Keywords

    • Image analysis
    • Inhomogeneous deformation
    • Micro-tomography
    • Synchrotron radiation
    • Three-dimensional

    ASJC Scopus subject areas

    • Materials Science (miscellaneous)

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