Abstract
The yield of chips tends to decrease with the degree of integration of memory chips, which is presently a serious problem. A method is proposed to utilize the fault chips being discarded to produce a normal chip, increasing the apparent yield. The relation between the yield and the reliability of the fault memory chip system is discussed. Using the proposed method, the yield of 10% can be improved up to 40% without substantially decreasing the reliability of the fault chip memory system from that of a normal memory chip. The method was implemented using fault 16 K RAM, and the effectiveness of the method was verified.
| Original language | English |
|---|---|
| Pages (from-to) | 47-53 |
| Number of pages | 7 |
| Journal | Systems, computers, controls |
| Volume | 13 |
| Issue number | 1 |
| Publication status | Published - 1982 |
| Externally published | Yes |
ASJC Scopus subject areas
- General Engineering