Two methods for estimating product lifetimes from only warranty claims data

Kazuyuki Suzuki, Md Mesbahul Alam, Takuji Yoshikawa, Wataru Yamamoto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Knowledge about product lifetime derived from real usage (field) data is of great interest in reliability analysis. A preferred source of such knowledge is warranty data, which are generated and updated at no additional cost from customer claims during warranty coverage. However, warranty databases contain only failure-related data, non-failure data is not included. This makes analysis difficult. The present research proposes two alternative methods for estimating product lifetimes from warranty claims data only. Two alternative methods, maximum likelihood and semiparametric, are described for estimating product lifetimes from warranty claims data only. They consider two lifetime variables: exponential failure, which corresponds to random failure mode, and Weibull failure, which corresponds to wear-out failure mode. They use only usage-at-failure data including exponential failure data. Simulation demons frated their applicability.

Original languageEnglish
Title of host publicationProceedings - The 2nd IEEE International Conference on Secure System Integration and Reliability Improvement, SSIRI 2008
Pages111-119
Number of pages9
DOIs
Publication statusPublished - 2008
Externally publishedYes
Event2nd IEEE International Conference on Secure System Integration and Reliability Improvement, SSIRI 2008 - Yokohama, Japan
Duration: 2008 Jul 142008 Jul 17

Publication series

NameProceedings - The 2nd IEEE International Conference on Secure System Integration and Reliability Improvement, SSIRI 2008

Other

Other2nd IEEE International Conference on Secure System Integration and Reliability Improvement, SSIRI 2008
Country/TerritoryJapan
CityYokohama
Period08/7/1408/7/17

Keywords

  • Censoring distribution
  • Random failure
  • Reliability
  • Usage time disfribution
  • Wear-out failure

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Safety, Risk, Reliability and Quality

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