Universal relationship between low-field mobility and high-field carrier velocity in high-κ and SiO2 gate dielectric MOSFETs

Masumi Saitoh, Ken Uchida

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Universal relationship between low-field mobility and high-field carrier velocity in high-κ and SiO2 gate dielectric MOSFETs'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science

Physics & Astronomy