Abstract
The depth profiles of secondary ion mass spectrometry (SIMS) have been applied to analyze the distribution of 18O and metal oxide ions precisely at La0.6Sr0.4Co0.2Fe 0.8O3 - d/Gd0.1Ce0.9O 2 - x (GDC)/Y0.15Zr0.85O2 - y (YSZ) interfaces. 18O concentration peak was identified only under cathodic polarization with a constant current density of 0.071 A cm- 2 at 973 K under 18O2 atmosphere. The 18O peak position was corresponded to the Sr condensed zone where SrZrO3 was formed at the GDC/YSZ interfaces. The SrZrO3 formation and the 18O concentration profile pile-up are correlated to each other.
Original language | English |
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Pages (from-to) | 398-402 |
Number of pages | 5 |
Journal | Solid State Ionics |
Volume | 262 |
DOIs | |
Publication status | Published - 2014 Sept 1 |
Externally published | Yes |
Keywords
- Cathode
- Depth profiles
- Isotope labeling
- SIMS
- SOFC
ASJC Scopus subject areas
- Chemistry(all)
- Materials Science(all)
- Condensed Matter Physics