TY - CHAP
T1 - X-ray diffraction
AU - Nakasako, Masayoshi
N1 - Publisher Copyright:
© 2018, Springer Japan KK, part of Springer Nature.
PY - 2018
Y1 - 2018
N2 - X-ray diffraction is the basis for understanding X-ray diffraction imaging (XDI). In this chapter, the theoretical background of X-ray diffraction is introduced starting from Maxwell’s equation in the system of non-relativistic classical electromagnetism. First, fundamental equations are derived to describe electromagnetic waves emitted from accelerated electrons by solving Maxwell’s equation. The theory of dipole radiation is applied to electrons bound in atoms, and then the scattering cross section for Thomson scattering is derived. By applying this theory to a system composed of two or more electrons, the interference between the diffracted waves is described as the Fourier transform of the electron density in the system. The critical importance of the phases of the diffracted waves in structural analysis is demonstrated, and then, the experimental determination of phases in protein X-ray crystallography is briefly introduced.
AB - X-ray diffraction is the basis for understanding X-ray diffraction imaging (XDI). In this chapter, the theoretical background of X-ray diffraction is introduced starting from Maxwell’s equation in the system of non-relativistic classical electromagnetism. First, fundamental equations are derived to describe electromagnetic waves emitted from accelerated electrons by solving Maxwell’s equation. The theory of dipole radiation is applied to electrons bound in atoms, and then the scattering cross section for Thomson scattering is derived. By applying this theory to a system composed of two or more electrons, the interference between the diffracted waves is described as the Fourier transform of the electron density in the system. The critical importance of the phases of the diffracted waves in structural analysis is demonstrated, and then, the experimental determination of phases in protein X-ray crystallography is briefly introduced.
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U2 - 10.1007/978-4-431-56618-2_2
DO - 10.1007/978-4-431-56618-2_2
M3 - Chapter
AN - SCOPUS:85044836175
T3 - Springer Series in Optical Sciences
SP - 23
EP - 48
BT - Springer Series in Optical Sciences
PB - Springer Verlag
ER -