TY - JOUR
T1 - A 4.2–373 K Functional 800-MS/s 12-b Buffer-Then-Amplify Charge-Pump-Based Pipelined TI-SAR ADC With Integrated Active-Hold Technique
AU - Yamashita, Kaoru
AU - Yoshioka, Kentaro
AU - Ziegler, Christian
AU - Issakov, Vadim
AU - Ishikuro, Hiroki
N1 - Publisher Copyright:
© 1966-2012 IEEE.
PY - 2026
Y1 - 2026
N2 - This article presents a source-follower (SF) and charge-pump (CP)-based amplification that is linear and bias-calibration-free across a wide temperature range from 4.2 to 373 K, targeting pipelined analog-to-digital converters (ADCs). While prior SF and CP-based amplifiers suffer from poor linearity because the SF must drive large amplified signals, we propose a buffer-then-amplify (BTA) CP architecture that relocates the CP to the SF output. As a result, the SF only buffers unamplified small-swing residues, fully exploiting its intrinsic linearity and eliminating the need for high-order gain calibrations even in advanced process nodes. To further enhance robustness and efficiency, we introduce an adaptively biased class-AB SF. An integrated active-hold technique is also proposed to eliminate the timing and bandwidth mismatch between the first-pipeline-stage sampling capacitor and the sub-ADC by repurposing the SF as a hold buffer for the sub-ADC. The prototype 12-bit 800-MS/s pipelined time-interleaved successive approximation register (TI-SAR) ADC is fabricated in 12-nm FinFET technology. It achieves SNDR higher than 55.0 dB across the 4.2–373 K temperature range with 40-MHz input, and peak Walden figure-of-merit (FoMW) of 9.2 fJ/c.-step at 4.2 K. To the best of the authors’ knowledge, the achieved functional temperature range is the widest among >10-bit >300-MS/s ADCs.
AB - This article presents a source-follower (SF) and charge-pump (CP)-based amplification that is linear and bias-calibration-free across a wide temperature range from 4.2 to 373 K, targeting pipelined analog-to-digital converters (ADCs). While prior SF and CP-based amplifiers suffer from poor linearity because the SF must drive large amplified signals, we propose a buffer-then-amplify (BTA) CP architecture that relocates the CP to the SF output. As a result, the SF only buffers unamplified small-swing residues, fully exploiting its intrinsic linearity and eliminating the need for high-order gain calibrations even in advanced process nodes. To further enhance robustness and efficiency, we introduce an adaptively biased class-AB SF. An integrated active-hold technique is also proposed to eliminate the timing and bandwidth mismatch between the first-pipeline-stage sampling capacitor and the sub-ADC by repurposing the SF as a hold buffer for the sub-ADC. The prototype 12-bit 800-MS/s pipelined time-interleaved successive approximation register (TI-SAR) ADC is fabricated in 12-nm FinFET technology. It achieves SNDR higher than 55.0 dB across the 4.2–373 K temperature range with 40-MHz input, and peak Walden figure-of-merit (FoMW) of 9.2 fJ/c.-step at 4.2 K. To the best of the authors’ knowledge, the achieved functional temperature range is the widest among >10-bit >300-MS/s ADCs.
KW - Analog-to-digital conversion (ADC)
KW - buffer -then-amplify (BTA)
KW - charge pump (CP)
KW - integrated active hold
KW - pipelined-successive approximation register (SAR) ADC
KW - residue amplifier
KW - sample and hold
KW - sample-and-hold-amplifier (SHA)
KW - source follower (SF)
UR - https://www.scopus.com/pages/publications/105025653646
UR - https://www.scopus.com/pages/publications/105025653646#tab=citedBy
U2 - 10.1109/JSSC.2025.3642619
DO - 10.1109/JSSC.2025.3642619
M3 - Article
AN - SCOPUS:105025653646
SN - 0018-9200
VL - 61
SP - 977
EP - 989
JO - IEEE Journal of Solid-State Circuits
JF - IEEE Journal of Solid-State Circuits
IS - 3
ER -