A correction method for the determination of low atomic number elements in aerosols by XRF analysis by using an intensity ratio between Compton and Thomson scattering

Attempts were made to determine low atomic number elements such as Al and Si in aerosols by XRF analysis. A simple method for correcting X-ray absorption effect for low atomic number element determination was investigated by using an intensity ratio between Compton and Thomson scattering. A linear_ relationship was found between mean atomic number [formula omitted] of a sample and the scattering X-ray ratio (I_Com/I_Thom), as follows. [formula omitted] The mean atomic munber [formula omitted] of the aerosol sample was determined by measuring the scattering X-ray ratio (I_Com/I_Thom). The mass attenuation coefficient (X) for the sample was then calculated from the mean atomic number [formula omitted] and the measured wavelength (λ), as [formula omitted] Finally, the correction coefficient (t), which corrects the X-ray absorption effect, was calculated from the mass attenuation coefficient (X) and the aerosol mass weight (M), as [formula omitted] Therefore, it is possible to correct the X-ray absorption effect by only measuring the scattering X-ray ratio. In order to evaluate this correction method, the same aerosol samples were analyzed by alkali fusion/ICP-AES. The corrected values of Al, Si and Ga obtained by XRF analysis agreed well with those by ICP-AES. Therefore, this correction method for the XRF analysis can be applied to the determination of low atomic number elements such as Al and Si in aerosols.