TY - JOUR
T1 - Delta- T noise in the Kondo regime
AU - Hasegawa, Masahiro
AU - Saito, Keiji
N1 - Funding Information:
The authors thank R. Sakano and A. Oguri for fruitful comments and discussions. M.H. acknowledges financial support provided by the Grant-in-Aid for JSPS Fellows No. JP19J11360 and the Grant-in-Aid for Scientific Research No. 19H05603. K.S. was supported by Grants-in-Aid for Scientific Research (JP16H02211, JP19H05603, JP19H05791).
Publisher Copyright:
© 2021 American Physical Society.
PY - 2021/1/12
Y1 - 2021/1/12
N2 - We study the delta-T noise in the Kondo regime, which implies the charge current noise under the temperature bias for the SU(2) Kondo quantum dot. We propose an experimentally measurable quantity to quantify the low-temperature properties in the delta-T noise, S=S(TL,TR)-(1/2)[S(TL,TL)+S(TR,TR)], which yields the shot noise expression in the noninteracting limit. We calculate this quantity for the SU(2) Kondo quantum dot in the particle-hole symmetric case. We found that the S exhibits qualitatively the same behavior in both the electrochemical potential-biased case and the temperature-biased case. The quantitative difference appears as a difference of the coefficients of the noises, which reflects the difference of the Fermi distribution function: electrochemical potential biased or temperature biased.
AB - We study the delta-T noise in the Kondo regime, which implies the charge current noise under the temperature bias for the SU(2) Kondo quantum dot. We propose an experimentally measurable quantity to quantify the low-temperature properties in the delta-T noise, S=S(TL,TR)-(1/2)[S(TL,TL)+S(TR,TR)], which yields the shot noise expression in the noninteracting limit. We calculate this quantity for the SU(2) Kondo quantum dot in the particle-hole symmetric case. We found that the S exhibits qualitatively the same behavior in both the electrochemical potential-biased case and the temperature-biased case. The quantitative difference appears as a difference of the coefficients of the noises, which reflects the difference of the Fermi distribution function: electrochemical potential biased or temperature biased.
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U2 - 10.1103/PhysRevB.103.045409
DO - 10.1103/PhysRevB.103.045409
M3 - Article
AN - SCOPUS:85099305521
SN - 2469-9950
VL - 103
JO - Physical Review B
JF - Physical Review B
IS - 4
M1 - 045409
ER -