TY - GEN
T1 - Detecting Submicron-Scale Continuous Variation in Phase of AC Magnetic Field Around Micro-Circuit with Diamond Quantum Sensor
AU - Otsubo, Fuki
AU - Mikawa, Takumi
AU - Matsuzaki, Yuichiro
AU - Tokuda, Norio
AU - Mizuochi, Norikazu
AU - Ishi-Hayase, Junko
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - Magnetic field distribution is significant information for LSI failure analysis. In this study, we detected continuous change in phase of AC magnetic field as well as amplitude utilizing RF -dressed states of electron spins in diamond.
AB - Magnetic field distribution is significant information for LSI failure analysis. In this study, we detected continuous change in phase of AC magnetic field as well as amplitude utilizing RF -dressed states of electron spins in diamond.
UR - http://www.scopus.com/inward/record.url?scp=85206376522&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85206376522&partnerID=8YFLogxK
U2 - 10.1109/CLEO-PR60912.2024.10676628
DO - 10.1109/CLEO-PR60912.2024.10676628
M3 - Conference contribution
AN - SCOPUS:85206376522
T3 - 16th Pacific Rim Conference on Lasers and Electro-Optics, CLEO-PR 2024
BT - 16th Pacific Rim Conference on Lasers and Electro-Optics, CLEO-PR 2024
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 16th Pacific Rim Conference on Lasers and Electro-Optics, CLEO-PR 2024
Y2 - 4 August 2024 through 9 August 2024
ER -