Detecting Submicron-Scale Continuous Variation in Phase of AC Magnetic Field around Micro-Circuit with Diamond Quantum Sensor

Fuki Otsubo; Takumi Mikawa; Yuichiro Matsuzaki; Norio Tokuda; Norikazu Mizuochi; Junko Ishi-Hayase

Detecting Submicron-Scale Continuous Variation in Phase of AC Magnetic Field around Micro-Circuit with Diamond Quantum Sensor

Fuki Otsubo, Takumi Mikawa, Yuichiro Matsuzaki, Norio Tokuda, Norikazu Mizuochi, Junko Ishi-Hayase

物理情報工学科

研究成果: Paper › 査読

抄録

Magnetic field distribution is significant information for LSI failure analysis. In this study, we detected continuous change in phase of AC magnetic field as well as amplitude utilizing RF-dressed states of electron spins in diamond.

本文言語	English
出版ステータス	Published - 2024
イベント	2024 Conference on Lasers and Electro-Optics/Pacific Rim, CLEO-PR 2024 - Incheon, Korea, Republic of 継続期間: 2024 8月 4 → 2024 8月 8

Conference

Conference	2024 Conference on Lasers and Electro-Optics/Pacific Rim, CLEO-PR 2024
国/地域	Korea, Republic of
City	Incheon
Period	24/8/4 → 24/8/8

ASJC Scopus subject areas

器械工学
原子分子物理学および光学

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引用スタイル

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title = "Detecting Submicron-Scale Continuous Variation in Phase of AC Magnetic Field around Micro-Circuit with Diamond Quantum Sensor",

abstract = "Magnetic field distribution is significant information for LSI failure analysis. In this study, we detected continuous change in phase of AC magnetic field as well as amplitude utilizing RF-dressed states of electron spins in diamond.",

author = "Fuki Otsubo and Takumi Mikawa and Yuichiro Matsuzaki and Norio Tokuda and Norikazu Mizuochi and Junko Ishi-Hayase",

note = "Publisher Copyright: {\textcopyright} 2024 The Author(s); 2024 Conference on Lasers and Electro-Optics/Pacific Rim, CLEO-PR 2024 ; Conference date: 04-08-2024 Through 08-08-2024",

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T1 - Detecting Submicron-Scale Continuous Variation in Phase of AC Magnetic Field around Micro-Circuit with Diamond Quantum Sensor

AU - Otsubo, Fuki

AU - Mikawa, Takumi

AU - Matsuzaki, Yuichiro

AU - Tokuda, Norio

AU - Mizuochi, Norikazu

AU - Ishi-Hayase, Junko

PY - 2024

Y1 - 2024

N2 - Magnetic field distribution is significant information for LSI failure analysis. In this study, we detected continuous change in phase of AC magnetic field as well as amplitude utilizing RF-dressed states of electron spins in diamond.

AB - Magnetic field distribution is significant information for LSI failure analysis. In this study, we detected continuous change in phase of AC magnetic field as well as amplitude utilizing RF-dressed states of electron spins in diamond.

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M3 - Paper

AN - SCOPUS:85216096008

T2 - 2024 Conference on Lasers and Electro-Optics/Pacific Rim, CLEO-PR 2024

Y2 - 4 August 2024 through 8 August 2024

ER -