Experimental evaluation of coulomb-scattering-limited inversion-layer mobility of n-type metal-oxide-semiconductor field-effect transistors on Si(100), (110), and (111)-surfaces: Impact of correlation between conductivity mass and normal mass
- Yukio Nakabayashi
- , Takamitsu Ishihara
- , Toshinori Numata
- , Ken Uchida
- , Shinichi Takagi
研究成果: Article › 査読
2
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被引用数
(Scopus)