Experimental evaluation of coulomb-scattering-limited inversion-layer mobility of n-type metal-oxide-semiconductor field-effect transistors on Si(100), (110), and (111)-surfaces: Impact of correlation between conductivity mass and normal mass

Yukio Nakabayashi, Takamitsu Ishihara, Toshinori Numata, Ken Uchida, Shinichi Takagi

研究成果: Article › 査読

2 被引用数 (Scopus)

フィンガープリント

「Experimental evaluation of coulomb-scattering-limited inversion-layer mobility of n-type metal-oxide-semiconductor field-effect transistors on Si(100), (110), and (111)-surfaces: Impact of correlation between conductivity mass and normal mass」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

Physics & Astronomy

Engineering & Materials Science