Experimental study on nanoscale temperature measurement method using rotation of near-field polarization

Jumpei Nitta, Sho Kishimoto, Yoshihiro Taguchi, Toshiharu Saiki, Yuji Nagasaka

研究成果: Conference contribution

抄録

A novel nanoscale temperature measurement system using polarized near-field light which enables the high spatial resolution at nanoscale has been developed. In this measurement system, the temperature dependence of the rotation of the polarization plane in near field is detected. However, the signal light variation is extremely weak, therefore, more sensitive measurement system is required. In this paper, we proposed a novel high sensitive nanoscale temperature measurement method. In addition, this paper reports the analytical and experimental results by using platinum nanostructures in order to confirm the validity of the measurement principle.

本文言語English
ホスト出版物のタイトルOptical MEMS and Nanophotonics 2013, OMN 2013 - Proceedings
ページ41-42
ページ数2
DOI
出版ステータスPublished - 2013 12月 1
イベント2013 International Conference on Optical MEMS and Nanophotonics, OMN 2013 - Kanazawa, Japan
継続期間: 2013 8月 182013 8月 22

出版物シリーズ

名前International Conference on Optical MEMS and Nanophotonics
ISSN(印刷版)2160-5033
ISSN(電子版)2160-5041

Other

Other2013 International Conference on Optical MEMS and Nanophotonics, OMN 2013
国/地域Japan
CityKanazawa
Period13/8/1813/8/22

ASJC Scopus subject areas

  • ハードウェアとアーキテクチャ
  • 電子工学および電気工学
  • 電子材料、光学材料、および磁性材料

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