Eye blink artifact rejection in single-channel electroencephalographic signals by complete ensemble empirical mode decomposition and independent component analysis

Suguru Kanoga; Yasue Mitsukura

doi:10.1109/EMBC.2015.7318315

Eye blink artifact rejection in single-channel electroencephalographic signals by complete ensemble empirical mode decomposition and independent component analysis

Suguru Kanoga, Yasue Mitsukura

システムデザイン工学科

研究成果: Conference contribution

16 被引用数 (Scopus)

抄録

To study an eye blink artifact rejection scheme from single-channel electroencephalographic (EEG) signals has been now a major challenge in the field of EEG signal processing. High removal performance is still needed to more strictly investigate pattern of EEG features. This paper proposes a new eye blink artifact rejection scheme from single-channel EEG signals by combining complete ensemble empirical mode decomposition (CEEMD) and independent component analysis (ICA). We compare the separation performance of our proposed scheme with existing schemes (wavelet-ICA, EMD-ICA, and EEMD-ICA) though real-life data by using signal-to-noise ratio. As a result, CEEMD-ICA showed high performance (11.86 dB) than all other schemes (10.78, 10.59, and 11.30 dB) in the ability of eye blink artifact removal.

本文言語	English
ホスト出版物のタイトル	2015 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015
出版社	Institute of Electrical and Electronics Engineers Inc.
ページ	121-124
ページ数	4
ISBN（電子版）	9781424492718
DOI	https://doi.org/10.1109/EMBC.2015.7318315
出版ステータス	Published - 2015 11月 4
イベント	37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015 - Milan, Italy 継続期間: 2015 8月 25 → 2015 8月 29

出版物シリーズ

名前	Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS
巻	2015-November
ISSN（印刷版）	1557-170X

Other

Other	37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015
国/地域	Italy
City	Milan
Period	15/8/25 → 15/8/29

ASJC Scopus subject areas

信号処理
健康情報学
コンピュータビジョンおよびパターン認識
生体医工学

文献へのアクセス

10.1109/EMBC.2015.7318315

他のファイルとリンク

フィンガープリント

「Eye blink artifact rejection in single-channel electroencephalographic signals by complete ensemble empirical mode decomposition and independent component analysis」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル

Kanoga, S., & Mitsukura, Y. (2015). Eye blink artifact rejection in single-channel electroencephalographic signals by complete ensemble empirical mode decomposition and independent component analysis. In 2015 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015 (pp. 121-124). 記事 7318315 (Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS; Vol. 2015-November). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EMBC.2015.7318315

Eye blink artifact rejection in single-channel electroencephalographic signals by complete ensemble empirical mode decomposition and independent component analysis. / Kanoga, Suguru; Mitsukura, Yasue.
2015 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015. Institute of Electrical and Electronics Engineers Inc., 2015. p. 121-124 7318315 (Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS; Vol. 2015-November).

研究成果: Conference contribution

Kanoga, S & Mitsukura, Y 2015, Eye blink artifact rejection in single-channel electroencephalographic signals by complete ensemble empirical mode decomposition and independent component analysis. in 2015 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015., 7318315, Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS, vol. 2015-November, Institute of Electrical and Electronics Engineers Inc., pp. 121-124, 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015, Milan, Italy, 15/8/25. https://doi.org/10.1109/EMBC.2015.7318315

Kanoga S, Mitsukura Y. Eye blink artifact rejection in single-channel electroencephalographic signals by complete ensemble empirical mode decomposition and independent component analysis. In 2015 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015. Institute of Electrical and Electronics Engineers Inc. 2015. p. 121-124. 7318315. (Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS). doi: 10.1109/EMBC.2015.7318315

Kanoga, Suguru ; Mitsukura, Yasue. / Eye blink artifact rejection in single-channel electroencephalographic signals by complete ensemble empirical mode decomposition and independent component analysis. 2015 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 121-124 (Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS).

@inproceedings{399721006fb24412956d511b58f09dca,

title = "Eye blink artifact rejection in single-channel electroencephalographic signals by complete ensemble empirical mode decomposition and independent component analysis",

abstract = "To study an eye blink artifact rejection scheme from single-channel electroencephalographic (EEG) signals has been now a major challenge in the field of EEG signal processing. High removal performance is still needed to more strictly investigate pattern of EEG features. This paper proposes a new eye blink artifact rejection scheme from single-channel EEG signals by combining complete ensemble empirical mode decomposition (CEEMD) and independent component analysis (ICA). We compare the separation performance of our proposed scheme with existing schemes (wavelet-ICA, EMD-ICA, and EEMD-ICA) though real-life data by using signal-to-noise ratio. As a result, CEEMD-ICA showed high performance (11.86 dB) than all other schemes (10.78, 10.59, and 11.30 dB) in the ability of eye blink artifact removal.",

author = "Suguru Kanoga and Yasue Mitsukura",

note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015 ; Conference date: 25-08-2015 Through 29-08-2015",

year = "2015",

month = nov,

day = "4",

doi = "10.1109/EMBC.2015.7318315",

language = "English",

series = "Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "121--124",

booktitle = "2015 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015",

}

TY - GEN

T1 - Eye blink artifact rejection in single-channel electroencephalographic signals by complete ensemble empirical mode decomposition and independent component analysis

AU - Kanoga, Suguru

AU - Mitsukura, Yasue

PY - 2015/11/4

Y1 - 2015/11/4

N2 - To study an eye blink artifact rejection scheme from single-channel electroencephalographic (EEG) signals has been now a major challenge in the field of EEG signal processing. High removal performance is still needed to more strictly investigate pattern of EEG features. This paper proposes a new eye blink artifact rejection scheme from single-channel EEG signals by combining complete ensemble empirical mode decomposition (CEEMD) and independent component analysis (ICA). We compare the separation performance of our proposed scheme with existing schemes (wavelet-ICA, EMD-ICA, and EEMD-ICA) though real-life data by using signal-to-noise ratio. As a result, CEEMD-ICA showed high performance (11.86 dB) than all other schemes (10.78, 10.59, and 11.30 dB) in the ability of eye blink artifact removal.

AB - To study an eye blink artifact rejection scheme from single-channel electroencephalographic (EEG) signals has been now a major challenge in the field of EEG signal processing. High removal performance is still needed to more strictly investigate pattern of EEG features. This paper proposes a new eye blink artifact rejection scheme from single-channel EEG signals by combining complete ensemble empirical mode decomposition (CEEMD) and independent component analysis (ICA). We compare the separation performance of our proposed scheme with existing schemes (wavelet-ICA, EMD-ICA, and EEMD-ICA) though real-life data by using signal-to-noise ratio. As a result, CEEMD-ICA showed high performance (11.86 dB) than all other schemes (10.78, 10.59, and 11.30 dB) in the ability of eye blink artifact removal.

UR - http://www.scopus.com/inward/record.url?scp=84953248977&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84953248977&partnerID=8YFLogxK

U2 - 10.1109/EMBC.2015.7318315

DO - 10.1109/EMBC.2015.7318315

M3 - Conference contribution

C2 - 26736215

AN - SCOPUS:84953248977

T3 - Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS

SP - 121

EP - 124

BT - 2015 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015

Y2 - 25 August 2015 through 29 August 2015

ER -