First-principles core-level X-ray photoelectron spectroscopy calculation on arsenic defects in silicon crystal

Hiroki Kishi; Miki Miyazawa; Naoki Matsushima; Jun Yamauchi

doi:10.1063/1.4865641

First-principles core-level X-ray photoelectron spectroscopy calculation on arsenic defects in silicon crystal

Hiroki Kishi, Miki Miyazawa, Naoki Matsushima, Jun Yamauchi

物理学科

研究成果: Conference article › 査読

2 被引用数 (Scopus)

抄録

We investigate the X-ray photoelectron spectroscopy (XPS) binding energies of As 3d in Si for various defects in neutral and charged states by first-principles calculation. It is found that the complexes of a substitutional As and a vacancy in charged and neutral states explain the experimentally observed unknown peak very well.

本文言語	English
ページ（範囲）	226-229
ページ数	4
ジャーナル	AIP Conference Proceedings
巻	1583
DOI	https://doi.org/10.1063/1.4865641
出版ステータス	Published - 2014
イベント	2014 IEEE International Conference on Automation Science and Engineering, CASE 2014 - Taipei, Taiwan, Province of China 継続期間: 2014 8月 18 → 2014 8月 22

ASJC Scopus subject areas

物理学および天文学（全般）

文献へのアクセス

10.1063/1.4865641

他のファイルとリンク

引用スタイル

@article{9e42cadc845f4a5190199fd318309ba2,

title = "First-principles core-level X-ray photoelectron spectroscopy calculation on arsenic defects in silicon crystal",

abstract = "We investigate the X-ray photoelectron spectroscopy (XPS) binding energies of As 3d in Si for various defects in neutral and charged states by first-principles calculation. It is found that the complexes of a substitutional As and a vacancy in charged and neutral states explain the experimentally observed unknown peak very well.",

keywords = "As, Si, X-ray photoelectron spectroscopy, XPS, defect, first-principles calculation",

author = "Hiroki Kishi and Miki Miyazawa and Naoki Matsushima and Jun Yamauchi",

note = "Publisher Copyright: {\textcopyright} 2014 AIP Publishing LLC.; 2014 IEEE International Conference on Automation Science and Engineering, CASE 2014 ; Conference date: 18-08-2014 Through 22-08-2014",

year = "2014",

doi = "10.1063/1.4865641",

language = "English",

volume = "1583",

pages = "226--229",

journal = "AIP Conference Proceedings",

issn = "0094-243X",

publisher = "American Institute of Physics Publising LLC",

}

TY - JOUR

T1 - First-principles core-level X-ray photoelectron spectroscopy calculation on arsenic defects in silicon crystal

AU - Kishi, Hiroki

AU - Miyazawa, Miki

AU - Matsushima, Naoki

AU - Yamauchi, Jun

PY - 2014

Y1 - 2014

N2 - We investigate the X-ray photoelectron spectroscopy (XPS) binding energies of As 3d in Si for various defects in neutral and charged states by first-principles calculation. It is found that the complexes of a substitutional As and a vacancy in charged and neutral states explain the experimentally observed unknown peak very well.

AB - We investigate the X-ray photoelectron spectroscopy (XPS) binding energies of As 3d in Si for various defects in neutral and charged states by first-principles calculation. It is found that the complexes of a substitutional As and a vacancy in charged and neutral states explain the experimentally observed unknown peak very well.

KW - As

KW - Si

KW - X-ray photoelectron spectroscopy

KW - XPS

KW - defect

KW - first-principles calculation

UR - http://www.scopus.com/inward/record.url?scp=85063851374&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85063851374&partnerID=8YFLogxK

U2 - 10.1063/1.4865641

DO - 10.1063/1.4865641

M3 - Conference article

AN - SCOPUS:85063851374

SN - 0094-243X

VL - 1583

SP - 226

EP - 229

JO - AIP Conference Proceedings

JF - AIP Conference Proceedings

T2 - 2014 IEEE International Conference on Automation Science and Engineering, CASE 2014

Y2 - 18 August 2014 through 22 August 2014

ER -

First-principles core-level X-ray photoelectron spectroscopy calculation on arsenic defects in silicon crystal

抄録

ASJC Scopus subject areas

文献へのアクセス

他のファイルとリンク

フィンガープリント

引用スタイル