TY - GEN
T1 - Human Face Detection System by Kenzan NET with preprocess analyzing hyperspectral image
AU - Chashikawa, Takakazu
AU - Fujii, Keizo
AU - Takefuji, Yoshiyasu
N1 - Publisher Copyright:
© 1999 IEEE.
PY - 1999
Y1 - 1999
N2 - This paper proposes a neural network system to detect human faces. Our scheme is composed of a preprocess and KenzanNET. Preprocessing analyzes hyperspectral images by using a hybrid self-organizing classification model to extract skin area and making a facial candidate pattern based on the extracted skin area. KenzanNET discriminate a face from other body parts. KenzanNET is a kind of feed forward neural network and is made from CombNET [ I[ improved by an additional learning function. Under the various conditions in terms of background and brightness in a room and the distance between people and camera, our system can detect human face with 76.9% accuracy.
AB - This paper proposes a neural network system to detect human faces. Our scheme is composed of a preprocess and KenzanNET. Preprocessing analyzes hyperspectral images by using a hybrid self-organizing classification model to extract skin area and making a facial candidate pattern based on the extracted skin area. KenzanNET discriminate a face from other body parts. KenzanNET is a kind of feed forward neural network and is made from CombNET [ I[ improved by an additional learning function. Under the various conditions in terms of background and brightness in a room and the distance between people and camera, our system can detect human face with 76.9% accuracy.
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U2 - 10.1109/IPMM.1999.792522
DO - 10.1109/IPMM.1999.792522
M3 - Conference contribution
AN - SCOPUS:85040015258
T3 - Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999
SP - 453
EP - 458
BT - Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999
A2 - Veiga, Marcello M.
A2 - Meech, John A.
A2 - Smith, Michael H.
A2 - LeClair, Steven R.
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999
Y2 - 10 July 1999 through 15 July 1999
ER -