In situ AP-XPS analysis of a Pt thin-film sensor for highly sensitive H2detection

Ryo Toyoshima; Takahisa Tanaka; Taro Kato; Ken Uchida; Hiroshi Kondoh

doi:10.1039/d0cc04030d

In situ AP-XPS analysis of a Pt thin-film sensor for highly sensitive H₂detection

Ryo Toyoshima
, Takahisa Tanaka
, Taro Kato
, Ken Uchida
, Hiroshi Kondoh

研究成果: Article › 査読

24 被引用数 (Scopus)

抄録

In situ ambient-pressure X-ray photoelectron spectroscopy (AP-XPS) combined with resistivity measurement was performed for a Pt thin-film H2 gas sensor. We experimentally demonstrate that the chemical state of the Pt surface changes under working conditions, and it directly links to the sensing performance. Moreover, the operating principle is discussed at the atomic scale.

本文言語	English
ページ（範囲）	10147-10150
ページ数	4
ジャーナル	Chemical Communications
巻	56
号	70
DOI	https://doi.org/10.1039/d0cc04030d
出版ステータス	Published - 2020 9月 11

ASJC Scopus subject areas

触媒
電子材料、光学材料、および磁性材料
セラミックおよび複合材料
化学一般
表面、皮膜および薄膜
金属および合金
材料化学

文献へのアクセス

10.1039/d0cc04030d

他のファイルとリンク

引用スタイル

@article{0f319d60479a48c3adee23e3c292b051,

title = "In situ AP-XPS analysis of a Pt thin-film sensor for highly sensitive H2detection",

abstract = "In situ ambient-pressure X-ray photoelectron spectroscopy (AP-XPS) combined with resistivity measurement was performed for a Pt thin-film H2 gas sensor. We experimentally demonstrate that the chemical state of the Pt surface changes under working conditions, and it directly links to the sensing performance. Moreover, the operating principle is discussed at the atomic scale.",

author = "Ryo Toyoshima and Takahisa Tanaka and Taro Kato and Ken Uchida and Hiroshi Kondoh",

note = "Publisher Copyright: {\textcopyright} The Royal Society of Chemistry.",

year = "2020",

month = sep,

day = "11",

doi = "10.1039/d0cc04030d",

language = "English",

volume = "56",

pages = "10147--10150",

journal = "Chemical Communications",

issn = "1359-7345",

publisher = "Royal Society of Chemistry",

number = "70",

}

TY - JOUR

T1 - In situ AP-XPS analysis of a Pt thin-film sensor for highly sensitive H2detection

AU - Toyoshima, Ryo

AU - Tanaka, Takahisa

AU - Kato, Taro

AU - Uchida, Ken

AU - Kondoh, Hiroshi

N1 - Publisher Copyright: © The Royal Society of Chemistry.

PY - 2020/9/11

Y1 - 2020/9/11

N2 - In situ ambient-pressure X-ray photoelectron spectroscopy (AP-XPS) combined with resistivity measurement was performed for a Pt thin-film H2 gas sensor. We experimentally demonstrate that the chemical state of the Pt surface changes under working conditions, and it directly links to the sensing performance. Moreover, the operating principle is discussed at the atomic scale.

AB - In situ ambient-pressure X-ray photoelectron spectroscopy (AP-XPS) combined with resistivity measurement was performed for a Pt thin-film H2 gas sensor. We experimentally demonstrate that the chemical state of the Pt surface changes under working conditions, and it directly links to the sensing performance. Moreover, the operating principle is discussed at the atomic scale.

UR - https://www.scopus.com/pages/publications/85090250877

UR - https://www.scopus.com/pages/publications/85090250877#tab=citedBy

U2 - 10.1039/d0cc04030d

DO - 10.1039/d0cc04030d

M3 - Article

C2 - 32734986

AN - SCOPUS:85090250877

SN - 1359-7345

VL - 56

SP - 10147

EP - 10150

JO - Chemical Communications

JF - Chemical Communications

IS - 70

ER -