抄録
The polarization stability of 850-nm GaAs-based vertical-cavity surface-emitting lasers (VCSEL's) under dynamic operation was investigated by comparing the characteristics of VCSEL's grown on (311)B and (100) GaAs substrates. Significantly larger suppression ratios of the two orthogonal polarization modes was obtained for VCSEL's on (311)B substrates than those on (100) substrates under zero-bias modulation. Time-dependent orthogonal polarization suppression ratio measurements also showed that the polarization direction was more stable in the VCSEL on (311)B substrates than that on (100) substrates. Error-free transmission was realized from VCSEL's on (311)B substrates with and without a polarizer in both back-to-back and 100-m multimode fiber transmission.
| 本文言語 | English |
|---|---|
| ページ（範囲） | 400-402 |
| ページ数 | 3 |
| ジャーナル | IEEE Photonics Technology Letters |
| 巻 | 11 |
| 号 | 4 |
| DOI | |
| 出版ステータス | Published - 1999 4月 |
| 外部発表 | はい |
ASJC Scopus subject areas
- 電子材料、光学材料、および磁性材料
- 原子分子物理学および光学
- 電子工学および電気工学