Long-term electroencephalogram measurement using polymer-based dry microneedle electrode

M. Arai, Y. Nishinaka, N. Miki

研究成果: Conference contribution

11 被引用数 (Scopus)

抄録

This paper reports a successful electroencephalogram (EEG) measurement for hours using polymer-based microneedle electrodes. Needle electrodes can penetrate through the stratum corneum and therefore, do not require any skin treatment for high-quality EEG measurement. The tested needles consist of SU-8 needles, a silver film, and a nanoporous parylene protective film. In prior work, fabrication processes of polymer-based microneedles, which are considered to be more robust than silicon microneedles was developed. In this work, the electrical impedance was measured at the forehead and was verified to maintain 6 kω for 3 h without any skin treatment, which was low enough for EEG measurement. A headset was designed to keep the contact between the needles and skin and with its help, EEG was successfully measured from the frontal poles. The acquired signals were found to be as high quality as the standard wet electrode that required skin treatment and uncomfortable pasting of conductive gel. The developed electrodes are readily applicable to record brain activities for hours while applying little mental and physical stress to the users.

本文言語English
ホスト出版物のタイトル2015 Transducers - 2015 18th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2015
出版社Institute of Electrical and Electronics Engineers Inc.
ページ81-84
ページ数4
ISBN(電子版)9781479989553
DOI
出版ステータスPublished - 2015 8月 5
イベント18th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2015 - Anchorage, United States
継続期間: 2015 6月 212015 6月 25

出版物シリーズ

名前2015 Transducers - 2015 18th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2015

Other

Other18th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2015
国/地域United States
CityAnchorage
Period15/6/2115/6/25

ASJC Scopus subject areas

  • 器械工学
  • 電子工学および電気工学

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