抄録
When there is the material that is high absorbency such as metal in the object, X-ray CT image often has artifacts that are abnormal findings. This artifact is called metal artifact. Metal artifact can be obstacle when examining objects accurately. Therefore, it is expected that artifact is reduced by a user of X-ray CT. To reduce metal artifact, various methods have been studied but any methods are not compatible with shape of the object and removing metal artifact. In this study, we applied the method with discriminant analysis method and sin curve interpolation. As a result, we could almost remove metal artifact and keep shape of object. However, cross artifact was left in the nonmetal part in the method.
| 本文言語 | English |
|---|---|
| ホスト出版物のタイトル | 2017 56th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2017 |
| 出版社 | Institute of Electrical and Electronics Engineers Inc. |
| ページ | 894-897 |
| ページ数 | 4 |
| 巻 | 2017-November |
| ISBN（電子版） | 9784907764579 |
| DOI | |
| 出版ステータス | Published - 2017 11月 10 |
| イベント | 56th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2017 - Kanazawa, Japan 継続期間: 2017 9月 19 → 2017 9月 22 |
Other
| Other | 56th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2017 |
|---|---|
| 国/地域 | Japan |
| City | Kanazawa |
| Period | 17/9/19 → 17/9/22 |
ASJC Scopus subject areas
- コンピュータ サイエンスの応用
- 制御と最適化
- 制御およびシステム工学
- 器械工学