Neurite imaging of living PC12 cells with scanning electrochemical/near- field optical/atomic force microscopy

Akio Ueda; Osamu Niwa; Kenichi Maruyama; Yutaka Shindo; Kotaro Oka; Koji Suzuki

doi:10.1002/anie.200702617

Neurite imaging of living PC12 cells with scanning electrochemical/near- field optical/atomic force microscopy

Akio Ueda, Osamu Niwa, Kenichi Maruyama, Yutaka Shindo, Kotaro Oka, Koji Suzuki

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研究成果: Article › 査読

42 被引用数 (Scopus)

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Protection is the key: Improved resolution imaging is demonstrated with the title technique, in which a bent probe is surrounded by a 100-nm protective layer to prevent direct contact between the electrode and the sample. Submicrometer structures and characteristic chemical sites can be imaged in three different modes, as demonstrated for neurites of PC12 cells (see picture). (Figure Presented).

本文言語	English
ページ（範囲）	8238-8241
ページ数	4
ジャーナル	Angewandte Chemie - International Edition
巻	46
号	43
DOI	https://doi.org/10.1002/anie.200702617
出版ステータス	Published - 2007

ASJC Scopus subject areas

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化学 (全般)

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10.1002/anie.200702617

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abstract = "Protection is the key: Improved resolution imaging is demonstrated with the title technique, in which a bent probe is surrounded by a 100-nm protective layer to prevent direct contact between the electrode and the sample. Submicrometer structures and characteristic chemical sites can be imaged in three different modes, as demonstrated for neurites of PC12 cells (see picture). (Figure Presented).",

keywords = "Neurites, PC12 cells, Scanning electrochemical microscopy, Scanning probe microscopy, Surface analysis",

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doi = "10.1002/anie.200702617",

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AU - Ueda, Akio

AU - Niwa, Osamu

AU - Maruyama, Kenichi

AU - Shindo, Yutaka

AU - Oka, Kotaro

AU - Suzuki, Koji

PY - 2007

Y1 - 2007

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KW - Neurites

KW - PC12 cells

KW - Scanning electrochemical microscopy

KW - Scanning probe microscopy

KW - Surface analysis

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JF - Angewandte Chemie - International Edition

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Neurite imaging of living PC12 cells with scanning electrochemical/near- field optical/atomic force microscopy

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