TY - GEN
T1 - Notice of Removal
T2 - 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015
AU - Kobayashi, Takashi
AU - Tanaka, Toshiyuki
N1 - Publisher Copyright:
© 2015 The Society of Instrument and Control Engineers-SICE.
PY - 2015/9/30
Y1 - 2015/9/30
N2 - In X-ray CT, medical X-ray exposure is the key issue for patients. Recently, low dose exposure is demanded in the industrial X-ray CT. But the dose of X-ray and the image quality are directly correlated. Therefore, research objective is to get high quality images trying to minimize X-ray exposure. Specifically, we reduce the number of X-ray views. We supplied data by using linear interpolation. As a result, we were able to eliminate conspicuous line noise to occur by having reduced the number of views. But different noises extending to horizontal rotatory direction occurred in the method.
AB - In X-ray CT, medical X-ray exposure is the key issue for patients. Recently, low dose exposure is demanded in the industrial X-ray CT. But the dose of X-ray and the image quality are directly correlated. Therefore, research objective is to get high quality images trying to minimize X-ray exposure. Specifically, we reduce the number of X-ray views. We supplied data by using linear interpolation. As a result, we were able to eliminate conspicuous line noise to occur by having reduced the number of views. But different noises extending to horizontal rotatory direction occurred in the method.
KW - Linear interpolation
KW - Low dose exposure
KW - The number of views
KW - X-ray CT
UR - http://www.scopus.com/inward/record.url?scp=84960084953&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84960084953&partnerID=8YFLogxK
U2 - 10.1109/SICE.2015.7285467
DO - 10.1109/SICE.2015.7285467
M3 - Conference contribution
AN - SCOPUS:84960084953
T3 - 2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015
SP - 41
EP - 44
BT - 2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2015
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 28 July 2015 through 30 July 2015
ER -