抄録
This paper presents a design scheme that supplies logic circuits with very high reliability by providing redundancy to gate function logic using conventional gates. The basic redundant logic circuits are called Fault-Tolerant Gates (FTGs). The construction and design of FTGs, such as AND, OR, NOT, NAND, NOR and Exclusive OR gates, are described. The improved reliability of these FTGs is evaluated in comparison with conventional gates.
| 本文言語 | English |
|---|---|
| ページ（範囲） | 119-126 |
| ページ数 | 8 |
| ジャーナル | Journal of information processing |
| 巻 | 3 |
| 号 | 3 |
| 出版ステータス | Published - 1980 1月 1 |
| 外部発表 | はい |
ASJC Scopus subject areas
- コンピュータ サイエンス（全般）