抄録
Thin carbon films have been prepared by ArF excimer laser ablation of hard fullerene-based carbon in vacuum. The target material was obtained from a pressure-temperature treatment of C60 fullerene. Micro-Raman, electron energy loss and electron diffraction measurements of deposited films reveal distinct evidence of microcrystalline diamond. Appearance of the diamond fraction in the films can be related to a peculiar structure of the target substance.
本文言語 | English |
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ページ(範囲) | 929-933 |
ページ数 | 5 |
ジャーナル | Journal of Physics D: Applied Physics |
巻 | 29 |
号 | 3 |
DOI | |
出版ステータス | Published - 1996 3月 14 |
外部発表 | はい |
ASJC Scopus subject areas
- 電子材料、光学材料、および磁性材料
- 凝縮系物理学
- 音響学および超音波学
- 表面、皮膜および薄膜