Preface to Special Topic: Defects in Semiconductors

Tetsuya Yamamoto, Yasufumi Fujiwara, Kohei M. Itoh

研究成果: Editorial › 査読

ASJC Scopus subject areas

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title = "Preface to Special Topic: Defects in Semiconductors",

author = "Tetsuya Yamamoto and Yasufumi Fujiwara and Itoh, {Kohei M.}",

year = "2018",

month = apr,

day = "28",

doi = "10.1063/1.5036660",

language = "English",

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journal = "Journal of Applied Physics",

issn = "0021-8979",

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