TY - GEN
T1 - Proposal of Feature Value Selection Method for Time-Critical Learning
AU - Yuyama, Kanami
AU - Nishi, Hiroaki
N1 - Funding Information:
ACKNOWLEDGMENT This work was supported by Technology Foundation of the R&D project “Design of Information and Communication Platform for Future Smart Community Services” by the Ministry of Internal Affairs and Communications of Japan. Moreover, the authors express their gratitude to MEXT/JSPS KAKENHI Grant (B) Numbers JP17H01739.
Publisher Copyright:
© 2018 IEEE.
Copyright:
Copyright 2019 Elsevier B.V., All rights reserved.
PY - 2018/10/22
Y1 - 2018/10/22
N2 - The development of IoT has led to the creation of a data-enriched environment that enables data gathering by using distributed sensors and terminals. However, in this environment, the cost of data analysis has increased. Machine learning has gained attention for reducing the cost because enabling automatic data analysis, as well as multidimensional data, is expected. However, for enormous data, such as Big Data, we still have to pay costs. Therefore, selecting feature values when using machine learning technology is essential, especially as inputs of a classifier. Selecting the feature values increases its estimation accuracy. Moreover, the time cost, as well as calculation cost, needs consideration for the actual time-critical use of machine learning, especially in its learning process. Therefore, in this study, we proposed an algorithm that selected suitable feature values in required time. The proposed method consists of two stages: stepwise input selection stage using ANOVA and feature deletion stage according to the contribution rate of the features to estimate accuracy. These selection and deletion processes continue until the required processing time. We confirmed the efficiency of the proposed method by using an environment of a crystallization process in a factory and a household's occupancy estimation. A comparison with the original stepwise input method proved that the proposed method improved the estimation accuracy by 2% and 5% in the estimation of the substance amount of the crystallization process and household's occupancy, respectively.
AB - The development of IoT has led to the creation of a data-enriched environment that enables data gathering by using distributed sensors and terminals. However, in this environment, the cost of data analysis has increased. Machine learning has gained attention for reducing the cost because enabling automatic data analysis, as well as multidimensional data, is expected. However, for enormous data, such as Big Data, we still have to pay costs. Therefore, selecting feature values when using machine learning technology is essential, especially as inputs of a classifier. Selecting the feature values increases its estimation accuracy. Moreover, the time cost, as well as calculation cost, needs consideration for the actual time-critical use of machine learning, especially in its learning process. Therefore, in this study, we proposed an algorithm that selected suitable feature values in required time. The proposed method consists of two stages: stepwise input selection stage using ANOVA and feature deletion stage according to the contribution rate of the features to estimate accuracy. These selection and deletion processes continue until the required processing time. We confirmed the efficiency of the proposed method by using an environment of a crystallization process in a factory and a household's occupancy estimation. A comparison with the original stepwise input method proved that the proposed method improved the estimation accuracy by 2% and 5% in the estimation of the substance amount of the crystallization process and household's occupancy, respectively.
KW - ANOVA
KW - Feature value selection
KW - k-NN
KW - real-time feature selection
KW - time-constraint machine learning
UR - http://www.scopus.com/inward/record.url?scp=85057288141&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85057288141&partnerID=8YFLogxK
U2 - 10.1109/ETFA.2018.8502622
DO - 10.1109/ETFA.2018.8502622
M3 - Conference contribution
AN - SCOPUS:85057288141
T3 - IEEE International Conference on Emerging Technologies and Factory Automation, ETFA
SP - 1365
EP - 1371
BT - Proceedings - 2018 IEEE 23rd International Conference on Emerging Technologies and Factory Automation, ETFA 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 23rd IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2018
Y2 - 4 September 2018 through 7 September 2018
ER -