TY - GEN
T1 - Real-time environmental mode extraction of contact points described in 3 dimensional location and direction using quaternion for bilateral control
AU - Sakaino, Sho
AU - Sato, Tomoya
AU - Kubo, Ryogo
AU - Ohnishi, Kouhei
PY - 2008/1/1
Y1 - 2008/1/1
N2 - In this paper, real-time environmental recognition method is proposed. With this method, location of the contact points are described in three dimensions and directions of the forces are also described in three dimensions. At first, modes of the contact points are divided into two modes; "force mode" and "moment mode". After that, "external mode" and "internal mode" are extracted from each modes by DFT matrix. Finally, environmental modes are achieved from external mode. In this way, hierarchy of the modes is given. This hierarchy is essential for the three dimensional extraction. After the extraction, each of the matrices is normalized to assure the continuity of the transformation. The validity of the proposed method is confirmed by a experiment.
AB - In this paper, real-time environmental recognition method is proposed. With this method, location of the contact points are described in three dimensions and directions of the forces are also described in three dimensions. At first, modes of the contact points are divided into two modes; "force mode" and "moment mode". After that, "external mode" and "internal mode" are extracted from each modes by DFT matrix. Finally, environmental modes are achieved from external mode. In this way, hierarchy of the modes is given. This hierarchy is essential for the three dimensional extraction. After the extraction, each of the matrices is normalized to assure the continuity of the transformation. The validity of the proposed method is confirmed by a experiment.
UR - http://www.scopus.com/inward/record.url?scp=63149107467&partnerID=8YFLogxK
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U2 - 10.1109/IECON.2008.4758362
DO - 10.1109/IECON.2008.4758362
M3 - Conference contribution
AN - SCOPUS:63149107467
SN - 9781424417667
T3 - IECON Proceedings (Industrial Electronics Conference)
SP - 2574
EP - 2579
BT - Proceedings - 34th Annual Conference of the IEEE Industrial Electronics Society, IECON 2008
PB - IEEE Computer Society
ER -