抄録
Imperfections are introduced in anthracene single crystals by low energy (≤ 20 keV) X-ray irradiation. About 60% of these imperfections can be recovered by annealing. The activation energy for recovery of the structural defects is measured to be 1.12 eV, using triplet excitons as a probe.
| 本文言語 | English |
|---|---|
| ページ（範囲） | 560-562 |
| ページ数 | 3 |
| ジャーナル | Chemical Physics Letters |
| 巻 | 56 |
| 号 | 3 |
| DOI | |
| 出版ステータス | Published - 1978 6月 15 |
ASJC Scopus subject areas
- 物理学および天文学（全般）
- 物理化学および理論化学