TY - GEN
T1 - Reflectometry based on two-photon absorption of a silicon avalanche photodiode
AU - Tanaka, Y.
AU - Chua, P. G.
AU - Kurokawa, T.
AU - Tsuda, H.
AU - Naganuma, M.
AU - Takeda, M.
N1 - Publisher Copyright:
© 2002 IEEE.
PY - 2002
Y1 - 2002
N2 - Proposed and demonstrated a novel reflectometry system based on two-photon absorption process in a silicon photodetector. This method can measure the optical path difference of several millimeters to several meters with a simple system configuration. The study on improving the accuracy and resolution is currently under investigation. We also plan to apply the same method to measuring the surface shape of objects using the two-photon absorption of silicon image sensors.
AB - Proposed and demonstrated a novel reflectometry system based on two-photon absorption process in a silicon photodetector. This method can measure the optical path difference of several millimeters to several meters with a simple system configuration. The study on improving the accuracy and resolution is currently under investigation. We also plan to apply the same method to measuring the surface shape of objects using the two-photon absorption of silicon image sensors.
UR - https://www.scopus.com/pages/publications/84963705859
UR - https://www.scopus.com/pages/publications/84963705859#tab=citedBy
U2 - 10.1109/OFS.2002.1000807
DO - 10.1109/OFS.2002.1000807
M3 - Conference contribution
AN - SCOPUS:84963705859
T3 - 2002 15th Optical Fiber Sensors Conference Technical Digest, OFS 2002
SP - 577
EP - 580
BT - 2002 15th Optical Fiber Sensors Conference Technical Digest, OFS 2002
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 15th Optical Fiber Sensors Conference Technical Digest, OFS 2002
Y2 - 6 May 2002 through 10 May 2002
ER -