TY - JOUR
T1 - Saturated Reflection Detection for Reflection Removal Based on Convolutional Neural Network
AU - Yoshida, Taichi
AU - Funahashi, Isana
AU - Yamashita, Naoki
AU - Ikehara, Masaaki
N1 - Publisher Copyright:
© 2013 IEEE.
PY - 2022
Y1 - 2022
N2 - Single image reflection removal is a technique that removes undesirable reflections, which occur due to glass, from images. Various methods of reflection removal have been proposed, but unfortunately, they usually fail to remove reflections particularly with very high pixel values. In this paper, we define these saturated reflections and their characteristics, as well as discuss and propose a removal system. The proposed system detects areas of saturated reflections based on our proposed model of convolutional neural networks and restores them by a conventional method of image estimation. In our experiments, the proposed system shows better peak-signal-to-noise ratio scores and perceptual quality than conventional methods of reflection removal.
AB - Single image reflection removal is a technique that removes undesirable reflections, which occur due to glass, from images. Various methods of reflection removal have been proposed, but unfortunately, they usually fail to remove reflections particularly with very high pixel values. In this paper, we define these saturated reflections and their characteristics, as well as discuss and propose a removal system. The proposed system detects areas of saturated reflections based on our proposed model of convolutional neural networks and restores them by a conventional method of image estimation. In our experiments, the proposed system shows better peak-signal-to-noise ratio scores and perceptual quality than conventional methods of reflection removal.
KW - Single image reflection removal
KW - convolutional neural network
KW - image inpainting
KW - reflection detection
UR - http://www.scopus.com/inward/record.url?scp=85128313393&partnerID=8YFLogxK
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U2 - 10.1109/ACCESS.2022.3166186
DO - 10.1109/ACCESS.2022.3166186
M3 - Article
AN - SCOPUS:85128313393
SN - 2169-3536
VL - 10
SP - 39800
EP - 39809
JO - IEEE Access
JF - IEEE Access
ER -