抄録
A self-organized fringe pattern in a single amorphous mark of a GeTe thin film was formed by multiple femtosecond pulse amorphization. Micro Raman measurement indicates that the fringe is a periodic alternation between crystalline and amorphous phases. The period of the fringe is smaller than the irradiation wavelength and the direction is parallel to the polarization direction. Snapshot observation revealed that the fringe pattern manifests itself via a complex but coherent process, which is attributed to crystallization properties unique to a nonthermally amorphized phase and the distinct optical contrast between crystalline and amorphous phases.
本文言語 | English |
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論文番号 | 031907 |
ジャーナル | Applied Physics Letters |
巻 | 105 |
号 | 3 |
DOI | |
出版ステータス | Published - 2014 7月 21 |
ASJC Scopus subject areas
- 物理学および天文学(その他)