Surface morphology of gold thin films deposited on poly(ethylene naphthalate) organic films for quantum cross devices

Hideo Kaiju, Akito Ono, Nobuyoshi Kawaguchi, Akira Ishibashi

研究成果: Article査読

11 被引用数 (Scopus)

抄録

The surface morphology of gold thin films deposited on poly(ethylene naphtalate) (PEN) organic films has been investigated for quantum cross devices. The surface roughness of gold thin films on the PEN films is 1.5-1.9nm and the appearance of mound structures is observed. The mound grain sizes are 28.0±4.6nm for 5-nm-thick gold films and 45.8 ±5.8nm for 10-nm-thick gold films. From the result of the scaling investigation of the surface roughness, the surface roughness of 5-nm-thick gold films is 0.22 nm, corresponding to one atomic size, in the scanning scale of 5 nm. These experimental results indicate that gold thin films on PEN films are suitable for use in quantum cross devices, and may open up a novel research field on the electric characteristics of quantum cross devices using a few atoms or molecules leading to high-density memories.

本文言語English
ページ(範囲)244-248
ページ数5
ジャーナルJapanese journal of applied physics
47
1
DOI
出版ステータスPublished - 2008 1月 18
外部発表はい

ASJC Scopus subject areas

  • 工学一般
  • 物理学および天文学一般

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