Surface potential measurement of fullerene derivative/copper phthalocyanine on indium tin oxide electrode by Kelvin probe force microscopy

Nobuo Satoh; Michio Yamaki; Kei Noda; Shigetaka Katori; Kei Kobayashi; Kazumi Matsushige; Hirofumi Yamada

doi:10.7567/JJAP.54.08KF06

Surface potential measurement of fullerene derivative/copper phthalocyanine on indium tin oxide electrode by Kelvin probe force microscopy

Nobuo Satoh, Michio Yamaki, Kei Noda, Shigetaka Katori, Kei Kobayashi, Kazumi Matsushige, Hirofumi Yamada

研究成果: Article › 査読

4 被引用数 (Scopus)

抄録

We have investigated the organic semiconductor thin films deposited by vacuum evaporation deposition using intersecting metal shadow masks on indium tin oxide (ITO) electrode/glass substrates to simulate organic solar cells by simultaneous observation with dynamic force microscopy (DFM)/Kelvin-probe force microscopy (KFM). The energy band diagram was depicted by simultaneously obtaining topographic and surface potential images of the same area using DFM/KFM. We considered the charge behavior at the interface having band bending in the phenyl-C61-butyric acid methyl ester (PCBM) film.

本文言語	English
論文番号	08KF06
ジャーナル	Japanese journal of applied physics
巻	54
号	8
DOI	https://doi.org/10.7567/JJAP.54.08KF06
出版ステータス	Published - 2015 8月 1
外部発表	はい

ASJC Scopus subject areas

工学（全般）
物理学および天文学（全般）

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10.7567/JJAP.54.08KF06

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引用スタイル

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AU - Kobayashi, Kei

AU - Matsushige, Kazumi

AU - Yamada, Hirofumi

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