TY - CHAP
T1 - Theory of X-ray diffraction imaging
AU - Nakasako, Masayoshi
N1 - Publisher Copyright:
© 2018, Springer Japan KK, part of Springer Nature.
PY - 2018
Y1 - 2018
N2 - X-ray diffraction imaging (XDI) is a technique for visualizing the structures of non-crystalline particles with dimensions ranging from micrometers to submicrometers. In XDI experiments, non-crystalline particles are irradiated by X-rays with high transverse coherence. Then, the Fraunhofer diffraction pattern is recorded under the oversampling condition at a desired resolution. The electron density map of the particle projected along the direction of the incident X-ray is reconstructed by applying the phase-retrieval (PR) algorithm to the diffraction pattern alone. In this chapter, the spatial coherence of X-rays, the X-ray source necessary for XDI, and the representative algorithms used for PR are introduced.
AB - X-ray diffraction imaging (XDI) is a technique for visualizing the structures of non-crystalline particles with dimensions ranging from micrometers to submicrometers. In XDI experiments, non-crystalline particles are irradiated by X-rays with high transverse coherence. Then, the Fraunhofer diffraction pattern is recorded under the oversampling condition at a desired resolution. The electron density map of the particle projected along the direction of the incident X-ray is reconstructed by applying the phase-retrieval (PR) algorithm to the diffraction pattern alone. In this chapter, the spatial coherence of X-rays, the X-ray source necessary for XDI, and the representative algorithms used for PR are introduced.
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U2 - 10.1007/978-4-431-56618-2_3
DO - 10.1007/978-4-431-56618-2_3
M3 - Chapter
AN - SCOPUS:85044822417
T3 - Springer Series in Optical Sciences
SP - 49
EP - 74
BT - Springer Series in Optical Sciences
PB - Springer Verlag
ER -