Time-of-flight secondary mass spectrometry analysis of isotope composition for measurement of self-diffusion coefficient

Fumitomo Onishi, Yuko Inatomi, Tomohiro Tanaka, Naoto Shinozaki, Masahito Watanabe, Akira Fujimoto, Kouhei Itoh

研究成果: Article査読

5 被引用数 (Scopus)

抄録

The analysis of isotope ratio in a material consisting of a single element was developed as a fundamental technique to determine a self-diffusion coefficient in a melt based on time-of-flight secondary mass spectrometry (TOF-SIMS). The self-diffusion coefficient for a pure Ge melt was measured using the stable isotope 73Ge as a tracer under a homogeneous static magnetic field in order to evaluate the influence of thermal convection upon isotope distribution. The results obtained showed that the magnetohydrodynamic effect in the melt obviously damped the convection, but it was not strong enough for the self-diffusion measurement.

本文言語English
ページ(範囲)5274-5276
ページ数3
ジャーナルJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
45
6 A
DOI
出版ステータスPublished - 2006

ASJC Scopus subject areas

  • 工学一般
  • 物理学および天文学一般

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