Understanding of a Pt thin-film H2 sensor under working conditions using AP-XPS and XAFS

Ryo Toyoshima, Takahisa Tanaka, Taro Kato, Hitoshi Abe, Ken Uchida, Hiroshi Kondoh

研究成果: Article査読

抄録

The operating principle of a Pt thin-film H2 gas sensor was investigated using a combination of surface sensitive ambient-pressure X-ray photoelectron spectroscopy and bulk sensitive X-ray absorption fine structure techniques, which provided chemical and structure information under working conditions, coupled with electric resistivity measurements. It is shown that the sensor response was in a linear relation with both coverages of H and O atoms on the Pt surface. Moreover, the bulk structure of Pt remains unchanged under H2 exposure. These observations support that the resistivity change is associated with electron scattering in the near-surface region.

本文言語English
論文番号upad031
ジャーナルChemistry Letters
53
2
DOI
出版ステータスPublished - 2024 2月

ASJC Scopus subject areas

  • 化学一般

フィンガープリント

「Understanding of a Pt thin-film H2 sensor under working conditions using AP-XPS and XAFS」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル